Key Features
- Supports high-speed laser beam scanning with precise position control.
- Achieves scan rates exceeding 200 MHz with sub-milliradian resolution.
- Customizable for 1D and 2D scanning, enabling versatile applications.
- Operates across a wide wavelength range, from 266 nm to 1064 nm.
- High diffraction efficiency (>80%) and broad RF frequency compatibility.
General Description
Acousto-Optic Deflectors (AOD) provide advanced solutions for high-speed laser beam scanning, leveraging the modulation of RF driving frequencies to achieve precise deflection and beam positioning. The AODs facilitate random position scanning, continuous line scanning, and sequential point deflection, offering exceptional flexibility for diverse applications.
The devices are designed for optimal efficiency, requiring alignment at the Bragg angle for maximum performance. POC has innovatively addressed potential inefficiencies caused by mismatched angles through the integration of longitudinal modes and phased array piezoelectric cells within the transducer. This results in large bandwidth AODs with superior resolution and reliability.
POC AODs are available for both 1D and 2D scanning and can be paired with specialized broadband RF drivers to enable advanced control methods, such as frequency sweeping and chirping. These features simplify implementation and empower users to perform complex tasks efficiently and effectively.
General Applications and Examples
- Laser Display Systems:
POC AODs provide smooth and rapid laser beam movement for high-resolution projection and imaging, ensuring vivid displays and minimal lag for industrial and entertainment applications. - Micromachining:
Precision laser deflection allows for intricate micromachining tasks, such as drilling and cutting, where accurate beam placement and movement are critical to achieving high-quality results. - Optical Inspection Systems:
Used in automated quality control systems, AODs enable high-speed scanning of laser beams across surfaces, identifying defects or inconsistencies with high precision. - Heterodyne Interferometry:
In metrology applications, AODs are used to modulate light beams for interference measurements, ensuring accurate readings in research and industrial environments.
Our Standard Products and Model Numbers
| Model Type | Center Frequency (MHz) | RF Range (MHz) | Aperture (mm) | Material | Mode | Wavelength (nm) | RF Connector | Housing |
|---|---|---|---|---|---|---|---|---|
| 1D-Deflectors | 70 | 10 ±10 | 1 | CQ / TE | C / S | 266 | SMA-F | A33 |
| 2D-Deflectors | 70 | 10 ±10 | 1 | CQ / TE | C / S | 266 | SMA-F | C66 |
Typical Specifications
| Wavelength (nm) | Aperture (mm² / mm) | Operating Frequency (MHz) | Scan Dimensions | Scanning Angle (mrad) | Diffraction Efficiency (%) | Material |
|---|---|---|---|---|---|---|
| 266 | 1 x 26 | 210 ±60 | 1D | 5.5 | >40 | CQ |
| 355 | 7 | 170 ±30 | 1D | 3.7 | >80 | CQ |
| 364 | 3.5 | 100 ±40 | 1D | 47 | >50 | TE |
| 405 | 4 | 100 ±25 | 1D | 32.4 | >70 | TE |
| 532 | 10 | 85 ±25 | 2D | 40 x 40 | >40 | TE |
Housing Dimensions (mm)
- A33: 38 x 20 x 16 mm, designed for compact setups and seamless integration.
- C66: 96 x 36.6 x 16 mm, ideal for high-power, high-frequency operations.
